Establishing an Effective Thermal Interface from the Die

TIM1 is located between the die and lid in a lidded package, while TIM1.5 is used in lidless packages to directly connect the bare die to a heat sink or cold plate. Both fill gaps between mating surfaces, reduce thermal contact resistance, and help transfer heat away from the die.

從晶粒建立有效的導熱介面
TIM1|封裝內部的導熱介面 和 TIM2|封裝與散熱結構的導熱介面
TIM1.5|裸晶與散熱結構的導熱介面

TIM1 | Thermal Interface Inside the Package

TIM1 connects the back of the die to the package lid and must provide a thin bond line, complete coverage, and stable contact despite package deformation.

TIM1.5 | Thermal Interface Between the Bare Die and Cooling Structure

Used in lidless packages to directly connect the bare die to a heat sink or cold plate, TIM1.5 must balance low thermal resistance, interface conformity, and the assembly stress applied to the die.

TIM2 | Thermal Interface Between the Package and Cooling Structure

TIM2 is located between the package lid and heat sink or cold plate, helping transfer heat from the package to the external cooling system.

Applications

AI 加速器

AI accelerators

伺服器處理器

Server Processors

HPC 運算晶片

HPC Computing Chips

多晶粒有蓋封裝

Multi-Die Lidded Packages

散熱與可靠度挑戰
散熱與可靠度挑戰

Thermal Management and Reliability Challenges

High-Power, Large Packages Place Greater Demands on Thermal Interfaces

As chip power consumption and package size increase, TIM1, TIM1.5 must not only reduce initial thermal resistance but also withstand temperature changes and package deformation. The material, bonded interfaces, and assembly process must work together to maintain long-term thermal performance.

01
Challenge

High Heat Density and Interface Thermal Resistance

Concentrated hot spots increase the cooling load, while material thermal conductivity, bond line thickness, and contact quality on both sides affect heat transfer efficiency from the die to the lid.

02
Challenge

Thin Bond Lines and Complete Coverage

A thin-layer design helps reduce bulk material thermal resistance, while gap filling and coverage must be controlled to prevent voids or locally unfilled areas.

03
Challenge

Package Warpage and Thermal Stress

Differences in thermal expansion among the die, lid, and substrate subject the interface to shear, tensile stress, and gap changes as temperatures fluctuate, placing demands on material compliance and adhesion stability.

04
Challenge

Material Pump-Out and Interface Degradation

Repeated thermal cycling may cause pump-out, dry-out, or delamination, degrading contact quality and increasing thermal resistance and the risk of localized hot spots.

散熱與可靠度挑戰
deco-thermal
deco-thermal

TIM1, TIM1.5 Materials Developed to Your Specifications

Different package designs have different requirements for thermal performance, bond line thickness, mechanical properties, and process compatibility.
LiPOLY adjusts material formulations and properties according to application specifications to support sampling, process evaluation, and package validation.

vertical_align_center
check

Thermal Performance and Bond Line Thickness

Define the material’s thermal performance and target bond line thickness based on power consumption, target thermal resistance, and bond gap, balancing a thin-layer design with effective gap filling.

Inputs

target thermal resistance, thermal conductivity, BLT, and bonding area.

check
massage

Conformability and Mechanical Properties

Adjust material compliance, adhesion, and deformability according to die size, bonding-surface materials, and package deformation conditions.

Inputs

hardness or modulus, adhesion requirements, warpage range, and rework requirements.

tile_medium
check

Application and Assembly Processes

Adjust flow and handling properties according to the material application method, assembly sequence, and production-line conditions; curing conditions for curable materials can also be defined as required.

Inputs

application method, viscosity, working life, assembly pressure, curing temperature, and curing time.

check
solar_power

Operating Environment and Reliability

Define material evaluation and validation conditions based on operating temperature, load variations, and reliability requirements to assess thermal resistance and interface performance over long-term use.

Inputs

Information you can provide: operating temperature, thermal cycling, power cycling, temperature-humidity conditions, and acceptance criteria.

From Specifications to Application Validation

01

Requirements Review

Review the package structure, target specifications, and process limitations.

02

Material Development and Sampling

Select materials or adjust formulations according to the requirements and provide samples.

03

Process and Package Testing

Verify bond quality and thermal performance under the customer’s application and assembly conditions.

04

Specification Confirmation and Implementation

Adjust the material based on test results and confirm the product specifications and subsequent implementation conditions.

Thermal Materials TIM1、TIM1.5 Computing Equipment

Related Product Solutions

6.0
W/m·K

Suitable for the thermal interface between the die and package lid, combining a thin bond line with post-cure softness.

Bond Line Thickness: 10 μm

Cured Hardness: 20 Shore A

Curable design that reduces the risk of material displacement

5.0
W/m·K

Combines thin-layer gap filling with post-cure softness and is suitable for evaluating thermal interface materials in chip packages.

Bond Line Thickness: 30 μm

Cured Hardness: 25 Shore A

Curable design that reduces the risk of material displacement

4.0
W/m·K

Provides thin-layer gap filling and curable forming properties and can be evaluated according to bonding conditions and process requirements.

Bond Line Thickness: 10 μm

Cured Hardness: 40 Shore A

Curable design that reduces the risk of material displacement

The values above are typical catalog values and are not guaranteed specifications; actual thermal resistance, process conditions, and reliability performance must be confirmed based on the package structure and test results.

Have Different Specification Requirements?

If your required bond line thickness, thermal performance, or process conditions differ from our existing products, submit your target specifications to discuss a custom development solution.

Learn more about TIM1、TIM1.5 Technical

TIM1、TIM1.5 是什麼?從有蓋封裝解析導熱介面的可靠度挑戰

Submit Your Package Conditions to Discuss a Custom TIM1,TIM1.5 Solution

In the “Requirements” field, provide the application conditions you have confirmed so our technical team can recommend suitable materials and development options.

support_agent

Technical Support

Evaluate the best thermal solution

trackpad_input

Material Selection

Quickly identify the right material combination

dashboard_2_edit

Custom Solutions

Create dedicated material solutions according to your needs

Package and Bonding: Die dimensions, bonding-surface materials, and target thickness (BLT).

Thermal Performance: Operating temperature, target thermal resistance, or thermal conductivity.

Assembly Process: Application method, assembly pressure, and curing conditions.

Reliability: : Test conditions, acceptance requirements, or issues to be improved in the current material.

You may begin by providing the information already available; our technical team will work with you to confirm the remaining details.